XF SENSOR FAMILY

With XF area scan sensor family AWAIBA offers the ‘Global shutter’ image sensors for particularly demanding applications. These sensors are designed for use in industrial inspection, optical metrology, scientific and high speed imaging. The sensors feature high quality on-chip AD conversion, bit parallel digital data interface with 10bit resolution and full on-chip managed integration and readout sequencing. Furthermore, the option for partial readout according to row direction greatly increases the achievable frame rate.

XF-2336 4MPIX 500FPS

4Mpixel digital Global Shutter CMOS sensor with 500Fps
The XF-2336 is the Global Shutter image sensor which offers the highest available frame rate at 4Mpixel resolution. The 7um pixel technology comes with high sensitivity and outstanding MTF ideal for those demanding high speed applications where light intensity is a concern. The XF-2336’s bit parallel data interface is easy to integrate into small size, low weight high-speed cameras. With u-PGA packaging and a board designed to handle high G-forces, custom configurations and product integration are readily realized. The principal applications for the XF-2336 image sensors are in high-speed imaging, 3D pcb inspection, wafer inspection and document scanning. For more detail read the specifications for the
XF2336_short_specification_v06 here.

• Number of pixels: 2336 x 1728
• Colour: RGB; B&W
• Pixel size: 7um x 7um
• Frame rate at full resolution: 500
• Shutter type: Global
• Resolution: 10bit
• Pixel Clock: 133MHz
• Number of output Tabs: 16
• Interleaved readout and integration
• External trigger mode
• Power supply: 3.3V / 1.8V

XF-768 0.5MPIX 110FPS

768 x 576 digital Global Shutter CMOS sensor with 110Fps & very large pixels
Designed for cost-sensitive applications, the XF-768 sensor is able to offer high sensitivity, SNR and MTF by applying large pixel sizes in what is still a compact package. The sensor provides excellent full well capacity and NIR sensitivity up to 950nm. Furthermore, the various high dynamic range modes allow an ‘in’ scene contrast of up to 120dB. Meanwhile, the option for selecting partial readout or sub sampling in X & Y direction allows for a significant increase in the frame rate beyond the 110 Fps normally achieved at full resolution. The XF-768 digital sensor can easily be configured over either the I2C or SPI interfaces and requires just a single 3.3V supply. All required bias references are generated on-chip. The compact LCC package and the low power consumption makes it easy to integrate the sensor into compact equipment. Its principal uses are for solar cell inspection, data matrix readers, smart sensors and industrial vision. For more detail read the specifications for the XF-768_short_spec_v02here.

• Number of pixels: 768 x 576
• B&W with high NIR response
• Pixel size: 13.125um x 13.125um
• Full Well capacity: 80ke-
• Frame rate at full resolution: 110
• Shutter type: Global
• Resolution: 10bit
• Pixel Clock: 50MHz
• Interleaved readout and integration
• External trigger & free-running mode
• Power supply: 3.3V